Scanning Electron Microscopy and Focused Ion Beam
Zeiss EVO MA15
The Zeiss EVO is a variable pressure SEM designed for sample characterization and analytical analysis.
Key Features
- Electron beam operation from 0.1 to 30keV
- Varriable pressure mode of operation for non-conducting samples
- Bruker xFlash 6130 Energy Dispersive X-Ray Spectrometer
- Bruker eFlash Electron Backscattered Detector