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Scanning Electron Microscopy and Focused Ion Beam

Zeiss EVO MA15Zeiss EVO MA15

The Zeiss EVO is a variable pressure SEM designed for sample characterization and analytical analysis.

Key Features

  • Electron beam operation from 0.1 to 30keV
  • Varriable pressure mode of operation for non-conducting samples
  • Bruker xFlash 6130 Energy Dispersive X-Ray Spectrometer
  • Bruker eFlash Electron Backscattered Detector

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