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Transmission Electron Microscope

JEOL JEM 1400-Flash

JEOL JEM 1400-FlashThe JEM 1400-Flash provides high contrast TEM imaging with a lateral resolution down to 0.2 nm. The special sample holder together enables dual-axis electron tomography to capture three-dimensional structures.

Category Key Features
Magnification:

x10 to x1,200,000

Acceleration Voltage:

10 kV to 120 kV

Filament:

LaB6

Specimen Tilt Angle:

±70°

Sample Holder:

Fischione 2400 Dual Axis Tomography Holder

Camera

Gatan OneView
CMOS sensor with 15 µm pixels
4k x 4k pixels, 16 bits per pixel
25 frames per second


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