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Optical Microscopy

Transmission Electron Microscopy

Scanning Electron Microscopy and Focused Ion Beam

Atomic Force Microscopy

Sample Preparation Equipment

    • Dimpling grinder
    • Fischione plasma cleaner
    • Gatan Cryoplunge Cp3
    • Gatan precision ion polisher
    • Ladd critical point dryer
    • Leica EMFC7 ultramicrotome
    • Leica (Reichert) OMU3 ultramicrotome
    • Multi-prep polishing system
    • Slow speed diamond saw
    • SPI sputter coater
    • Wohlwend High Pressure Freezer

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