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Scanning Electron Microscope

Hitachi TM3030

Hitachi TM3030The Hitachi TM3030 is a table top Scanning Electron Microscope (SEM). The premium SE and BSE detectors operates effectively under the low-vacuum environment and allows for quick SE image observation of soft materials without specimen preparation.

Key Features


×15 to ×60,000 (Up to ×240,000 with digital zoom)

Observation condition:

5 kV/15 kV/EDX

Signal select:


Observation mode:

BSE:Conductor/Standard/Charge-up Reduction
SE:Standard/Charge-up Reduction
Mix:Standard/Charge-up Reduction

Image mode (BSE):

COMPO/Shadow 1/Shadow 2/TOPO

Sample stage traverse:

X: 35.0 mm, Y: 35.0 mm

Maximum sample size:

70 mm in diameter

Maximum sample height:

50 mm

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