Scanning Electron Microscope
Hitachi TM3030
The Hitachi TM3030 is a table top Scanning Electron Microscope (SEM). The premium SE and BSE detectors operates effectively under the low-vacuum environment and allows for quick SE image observation of soft materials without specimen preparation.
| Category | Key features |
|---|---|
| Magnification: | ×15 to ×60,000 (Up to ×240,000 with digital zoom) |
Observation condition: |
5 kV/15 kV/EDX |
Signal select: |
BSE/SE/Mix |
Observation mode: |
BSE:Conductor/Standard/Charge-up Reduction |
Image mode (BSE): |
COMPO/Shadow 1/Shadow 2/TOPO |
Sample stage traverse: |
X: 35.0 mm, Y: 35.0 mm |
Maximum sample size: |
70 mm in diameter |
Maximum sample height: |
50 mm |