Transmission Electron Microscope
JEOL JEM 1400-Flash
The JEM 1400-Flash provides high contrast TEM imaging with a lateral resolution down to 0.2 nm. The special sample holder together enables dual-axis electron tomography to capture three-dimensional structures.
| Category | Key Features |
|---|---|
| Magnification: | x10 to x1,200,000 |
Acceleration Voltage: |
10 kV to 120 kV |
Filament: |
LaB6 |
Specimen Tilt Angle: |
±70° |
Sample Holder: |
Fischione 2400 Dual Axis Tomography Holder |
Camera |
Gatan OneView |