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Transmission Electron Microscope

JEOL JEM 1400-Flash

JEOL JEM 1400-FlashThe JEM 1400-Flash provides high contrast TEM imaging with a lateral resolution down to 0.2 nm. The special sample holder together enables dual-axis electron tomography to capture three-dimensional structures.

Key Features


x10 to x1,200,000

Acceleration Voltage:

10 kV to 120 kV



Specimen Tilt Angle:


Sample Holder:

Fischione 2400 Dual Axis Tomography Holder


Gatan OneView
CMOS sensor with 15 µm pixels
4k x 4k pixels, 16 bits per pixel
25 frames per second

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